FLANDERS, N.J.--(BUSINESS WIRE)--Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization, photolithography equipment and software for the semiconductor, FPD, LED and ...

Using a focused-beam ellipsometer and small-site measurement optics, Rudolph Technologies’ S3000SX thin-film metrology system for 2X and 1X process nodes measures the thickness of single-layer and ...

We talk a lot about process nodes at ExtremeTech, but we don't often refer back to what a process node technically is. With Intel's 10nm node now in production and TSMC + Samsung talking about future ...