Recently, my colleague Robert Ruiz described a new approach to scan test that utilizes the high-speed I/O (HSIO) ports that exist on most chips. The benefits of this new approach include reduced test ...

PXI, PXIe, and AXIe—from per-pin parametric measurement units (PMUs) to RF/microwave instruments—are making inroads in the semiconductor test space as vendors introduce modules suitable for IC test.

Modular instruments provide a flexible, scalable way to test semiconductors—some of these individual instruments are described in a recent EE special report. 1 However, some modular-instrument vendors ...

Taiwan's IC test interface specialists including Chunghwa Precision Test Tech (CHPT) are striving hard to strengthen deployments in multiple market segments beyond handsets as demand for smartphone ...

Rapidly increasing chip and package complexity, coupled with an incessant demand for more reliability, has triggered a frenzy of alliances and working relationships that are starting to redefine how ...

IC test solutions providers including Chunghwa Precision Test Tech (CHPT), MPI and WinWay Technology have seen a strong influx of probe card and final-test socket orders for HPC processors, which will ...

Systems on a chip (SOC) design has led to dramatic growth in the verification and characterization efforts necessary to ensure a working design. In today's super-competitive environment – made even ...