Abstract: This paper mainly introduces the principle of scanning acoustic microscope (SAM). Cases on the pin delamination of the Plastic Encapsulated Microcircuits (PEMs) with different packages are ...
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How Musk 'grew' Tesla
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Abstract: Scanning acoustic microscope (SAM) inspection is becoming an essential nondestructive procedure to defect delamination, voids, cracks in the plastic encapsulated devices. The C-scan SAM ...
† Department of Chemical Engineering, University of Washington, Seattle, Washington 98195, United States Article Views are the COUNTER-compliant sum of full text article downloads since November 2008 ...
Atop the Horry County landfill, black smoke puffs from the exhaust pipe of a blue, 62-ton compactor with spiked metal wheels as it scales a pile of stinking garbage dumped by a truck seconds earlier.
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